Low-Frequency Diffusion Noise in Resistive-Switching...

IEEE Transactions on Electron Devices 2012 / 09 Vol. 59; Iss. 9

Low-Frequency Diffusion Noise in Resistive-Switching Memories Based on Metal–Oxide Polymer Structure

Rocha, Paulo R. F., Gomes, Henrique Leonel, Vandamme, Lode K. J., Chen, Qian, Kiazadeh, Asal, de Leeuw, Dago M., Meskers, Stefan C. J.
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2012.2204059
Date:
September, 2012
File:
PDF, 262 KB
english, 2012
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