Modeling of Drain Electric Flux Passing Through the BOX...

IEEE Transactions on Electron Devices 2014 / 9 Vol. 61; Iss. 9

Modeling of Drain Electric Flux Passing Through the BOX Layer in SoI MOSFETs—Part II: Model Derivation and Validity Confirmation

Yamada, Tatsuya, Hanajiri, Tatsuro, Toyabe, Toru
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2340900
Date:
September, 2014
File:
PDF, 2.34 MB
english, 2014
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