Hitest: A Knowledge-Based Test Generation System

IEEE Design & Test of Computers 1984 / 05 Vol. 1; Iss. 2

Hitest: A Knowledge-Based Test Generation System

Bending, Michael J.
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Volume:
1
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.1984.5005617
Date:
May, 1984
File:
PDF, 5.41 MB
english, 1984
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