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Volume 1; Issue 2

IEEE Design & Test of Computers

Volume 1; Issue 2
1

Testability Emphasis in the General Electric A/VLSI Program

Kroeger, Robert C.
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 1.48 MB
english, 1984
2

Linking Design&Test

Anderson, Robert E.
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 3.61 MB
english, 1984
4

Self-Testing the Motorola MC6804P2

Kuban, John R., Bruce, William C.
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 8.69 MB
english, 1984
5

CATA: A Computer-Aided Test Analysis System

Robach, Chantal, Malecha, Philippe, Michel, Gilles
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 7.06 MB
english, 1984
7

Prototype Debug using ATE

Florcik, David, Low, David, Roche, Martin
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 4.49 MB
english, 1984
8

The Fairchild Sentry 50 Tester: Establishing New ATE Performance Limits

Garcia, Rudy
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 7.43 MB
english, 1984
9

Hitest: A Knowledge-Based Test Generation System

Bending, Michael J.
Journal:
IEEE Design & Test of Computers
Year:
1984
Language:
english
File:
PDF, 5.41 MB
english, 1984