Corrections to “Quantum Mechanical Performance Predictions of p-n-i-n Versus Pocketed Line Tunnel Field-Effect Transistors” [Jul 13 2128-2134]
Verreck, Devin, Verhulst, Anne S., Kao, Kuo-Hsing, Vandenberghe, William G., De Meyer, Kristin, Groeseneken, GuidoVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2278209
Date:
October, 2013
File:
PDF, 153 KB
english, 2013