Development of a Technique for Characterizing Bias...

IEEE Transactions on Electron Devices 2014 / 9 Vol. 61; Iss. 9

Development of a Technique for Characterizing Bias Temperature Instability-Induced Device-to-Device Variation at SRAM-Relevant Conditions

Meng Duan,, Jian Fu Zhang,, Zhigang Ji,, Wei Dong Zhang,, Kaczer, Ben, Schram, Tom, Ritzenthaler, Romain, Groeseneken, Guido, Asenov, Asen
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2335053
Date:
September, 2014
File:
PDF, 2.95 MB
english, 2014
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