Microstructure evolution and leakage phenomena of CSD PLZT...

Integrated Ferroelectrics 1999 / 10 Vol. 26; Iss. 1-4

Microstructure evolution and leakage phenomena of CSD PLZT thin films

Fujiki, Mitsushi, Cross, Jeffrey S., Tsukada, Mineharu, Otani, Seigen, Kotaka, Yasutoshi, Goto, Yasuyuki, Matsuura, Katsuyoshi, Ashida, Hiroshi
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Volume:
26
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589908215627
Date:
October, 1999
File:
PDF, 589 KB
english, 1999
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