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Very high frequency performance of nanometre scale GaAs MESFETs
Adams, J.A., Thayne, I.G., Taylor, M.R.S., Wilkinson, C.D.W., Beaumont, S.P., Johnson, N.P., Kean, A.H., Stanley, C.R.Volume:
36
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/16.43722
Date:
January, 1989
File:
PDF, 155 KB
english, 1989