Correction to “Improved Low-Voltage-Triggered SCR Structure...

IEEE Electron Device Letters 2013 / 09 Vol. 34; Iss. 9

Correction to “Improved Low-Voltage-Triggered SCR Structure for RF-ESD Protection” [Aug 13 1050-1052]

Ma, Fei, Han, Yan, Dong, Shurong, Miao, Meng, Liang, Hailiang
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2275615
Date:
September, 2013
File:
PDF, 582 KB
english, 2013
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