Characterization and Modeling of Subfemtofarad Nanowire...

IEEE Electron Device Letters 2009 / 05 Vol. 30; Iss. 5

Characterization and Modeling of Subfemtofarad Nanowire Capacitance Using the CBCM Technique

Hui Zhao,, Raseong Kim,, Paul, A., Luisier, M., Klimeck, G., Fa-Jun Ma,, Rustagi, S.C., Samudra, G.S., Singh, N., Guo-Qiang Lo,, Dim-Lee Kwong,
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Volume:
30
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2015588
Date:
May, 2009
File:
PDF, 291 KB
english, 2009
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