Characterization of optical and electrical quality of...

Journal of Crystal Growth 2004 Vol. 261; Iss. 2-3

Characterization of optical and electrical quality of Mg-doped InxGa1−xN grown by MOCVD

Sung-Nam Lee, Tan Sakong, Wonseok Lee, Hosun Paek, Joongkon Son, Euijoon Yoon, Okhyun Nam, Y. Park
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Volume:
261
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.jcrysgro.2003.11.016
File:
PDF, 200 KB
english, 2004
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