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In situ X-ray diffraction during stacking of InAs/GaAs(0 0 1) quantum dot layers and photoluminescence spectroscopy
M. Takahasi, T. KaizuVolume:
311
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.jcrysgro.2008.09.202
File:
PDF, 350 KB
english, 2009