Variability and reliability analysis of CNFET technology: Impact of manufacturing imperfections
Almudever, Carmen G., Rubio, AntonioVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.11.011
Date:
February, 2015
File:
PDF, 2.12 MB
english, 2015