Characterizing the Electrical Properties of a Novel...

IEEE Electron Device Letters 2015 / 2 Vol. 36; Iss. 2

Characterizing the Electrical Properties of a Novel Junctionless Poly-Si Ultrathin-Body Field-Effect Transistor Using a Trench Structure

Yeh, Mu-Shih, Wu, Yung-Chun, Wu, Min-Hsin, Chung, Ming-Hsien, Jhan, Yi-Ruei, Hung, Min-Feng
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2014.2378785
Date:
February, 2015
File:
PDF, 1.47 MB
english, 2015
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