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3-d simulation of heavy-ion induced charge collection in SiGe HBTs
Varadharajaperumal, M., Guofu Niu,, Krithivasan, R., Cressler, J.D., Reed, R.A., Marshall, P.W., Vizkelethy, G., Dodd, P.E., Joseph, A.J.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.820775
Date:
December, 2003
File:
PDF, 886 KB
english, 2003