Superior Retention of Low-Resistance State in Conductive...

IEEE Electron Device Letters 2015 / 2 Vol. 36; Iss. 2

Superior Retention of Low-Resistance State in Conductive Bridge Random Access Memory With Single Filament Formation

Xu, Xiaoxin, Lv, Hangbing, Liu, Hongtao, Gong, Tiancheng, Wang, Guoming, Zhang, Meiyun, Li, Yang, Liu, Qi, Long, Shibing, Liu, Ming
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2014.2379961
Date:
February, 2015
File:
PDF, 1.04 MB
english, 2015
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