A study of cycling induced degradation mechanisms in Si...

Nanotechnology 2011 / 06 Vol. 22; Iss. 25

A study of cycling induced degradation mechanisms in Si nanocrystal memory devices

Jiang, Dandan, Zhang, Manhong, Huo, Zongliang, Wang, Qin, Liu, Jing, Yu, Zhaoan, Yang, Xiaonan, Wang, Yong, Zhang, Bo, Chen, Junning, Liu, Ming
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Volume:
22
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/22/25/254009
Date:
June, 2011
File:
PDF, 541 KB
english, 2011
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