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Statistical analysis of the impact of refinishing process on leaded components
Yin, Chunyan, Best, Chris, Bailey, Chris, Stoyanov, StoyanVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.11.001
Date:
February, 2015
File:
PDF, 2.25 MB
english, 2015