Improved performance of nanoscale junctionless transistor based on gate engineering approach
Wang, Ying, Shan, Chan, Dou, Zheng, Wang, Li-guo, Cao, FeiVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.11.009
Date:
February, 2015
File:
PDF, 2.55 MB
english, 2015