High speed test interface module using MEMS technology
Kandalaft, Nabeeh, Attaran, Ali, Rashizadeh, RashidVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.11.010
Date:
February, 2015
File:
PDF, 2.28 MB
english, 2015