Limits of the successive breakdown statistics to assess...

Limits of the successive breakdown statistics to assess chip reliability

Jordi Suñé, Ernest Y. Wu, Wing L. Lai
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Volume:
72
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2003.12.013
File:
PDF, 363 KB
english, 2004
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