Incidence of oxide and interface degradation on MOSFET...

Incidence of oxide and interface degradation on MOSFET performance

A Cester, L Bandiera, S Cimino, A Paccagnella, G Ghidini
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Volume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2003.12.018
File:
PDF, 206 KB
english, 2004
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