Electrical characterization of TiO2 gate oxides on...

Electrical characterization of TiO2 gate oxides on strained-Si

C.K. Maiti, S.K. Samanta, G.K. Dalapati, S.K. Nandi, S. Chatterjee
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
72
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2003.12.046
File:
PDF, 190 KB
english, 2004
Conversion to is in progress
Conversion to is failed