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Electrical characterization of TiO2 gate oxides on strained-Si
C.K. Maiti, S.K. Samanta, G.K. Dalapati, S.K. Nandi, S. ChatterjeeVolume:
72
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2003.12.046
File:
PDF, 190 KB
english, 2004