Charge trapping and detrapping in HfO2 high-κ gate stacks

Charge trapping and detrapping in HfO2 high-κ gate stacks

E.P Gusev, C D'Emic, S Zafar, A Kumar
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2004.01.003
File:
PDF, 221 KB
english, 2004
Conversion to is in progress
Conversion to is failed