Nature and location of interface traps in RF LDMOS due to...

Nature and location of interface traps in RF LDMOS due to hot carriers

T. Nigam, A. Shibib, S. Xu, H. Safar, L. Steinberg
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Volume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2004.01.033
File:
PDF, 387 KB
english, 2004
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