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Nature and location of interface traps in RF LDMOS due to hot carriers
T. Nigam, A. Shibib, S. Xu, H. Safar, L. SteinbergVolume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2004.01.033
File:
PDF, 387 KB
english, 2004