Frequency and gate voltage effects on the dielectric...

Microelectronic Engineering 2008 Vol. 85; Iss. 9

Frequency and gate voltage effects on the dielectric properties of Au/SiO2/n-Si structures

İlbilge Dökme, Şemsettin Altındal, Muharrem Gökçen
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Volume:
85
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2008.06.009
File:
PDF, 295 KB
english, 2008
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