Degradation dynamics and breakdown of MgO gate oxides

Microelectronic Engineering 2009 Vol. 86; Iss. 7-9

Degradation dynamics and breakdown of MgO gate oxides

E. Miranda, E. O’Connor, G. Hughes, P. Casey, K. Cherkaoui, S. Monaghan, R. Long, D. O’Connell, P.K. Hurley
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Volume:
86
Year:
2009
Language:
english
Pages:
3
DOI:
10.1016/j.mee.2009.03.009
File:
PDF, 419 KB
english, 2009
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