Reliability issues and modeling of Flash and post-Flash...

Microelectronic Engineering 2009 Vol. 86; Iss. 7-9

Reliability issues and modeling of Flash and post-Flash memory (Invited Paper)

Daniele Ielmini
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Volume:
86
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2009.03.054
File:
PDF, 678 KB
english, 2009
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