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In situ X-ray diffraction study of thin film Ir/Si solid state reactions
W. Knaepen, J. Demeulemeester, D. Deduytsche, J.L. Jordan-Sweet, A. Vantomme, R.L. Van Meirhaeghe, C. Detavernier, C. LavoieVolume:
87
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2009.06.002
File:
PDF, 694 KB
english, 2010