Temperature and frequency characterization of InAs nanowire...

Microelectronic Engineering 2011 Vol. 88; Iss. 4

Temperature and frequency characterization of InAs nanowire and HfO2 interface using capacitance–voltage method

Gvidas Astromskas, Kristian Storm, Philippe Caroff, Magnus Borgström, Erik Lind, Lars-Erik Wernersson
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Volume:
88
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.mee.2010.08.010
File:
PDF, 314 KB
english, 2011
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