Scanning tunneling microscopy study of the interfacial...

Microelectronic Engineering 2011 Vol. 88; Iss. 4

Scanning tunneling microscopy study of the interfacial bonding structures of Ga2O and In2O/In0.53Ga0.47As(0 0 1)

Jian Shen, Darby L. Feldwinn, Wilhelm Melitz, Ravi Droopad, Andrew C. Kummel
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Volume:
88
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2010.10.023
File:
PDF, 1.38 MB
english, 2011
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