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Study of deep level defect behavior in undoped n-InP (1 0 0) after rapid thermal annealing
V. Janardhanam, A. Ashok Kumar, V. Rajagopal Reddy, Chel Jong ChoiVolume:
88
Year:
2011
Language:
english
Pages:
3
DOI:
10.1016/j.mee.2010.10.031
File:
PDF, 227 KB
english, 2011