Effects of inhomogeneous negative bias temperature stress...

Microelectronics Reliability 2005 Vol. 45; Iss. 1

Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits

Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes
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Volume:
45
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2004.03.017
File:
PDF, 347 KB
english, 2005
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