Low voltage SILC and P- and N-MOSFET gate oxide reliability
C. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. MaurelVolume:
45
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.microrel.2004.08.002
File:
PDF, 438 KB
english, 2005