Effects of electrical stressing in power VDMOSFETs

Microelectronics Reliability 2005 Vol. 45; Iss. 1

Effects of electrical stressing in power VDMOSFETs

N. Stojadinovic, I. Manic, V. Davidovic, D. Dankovic, S. Djoric-Veljkovic, S. Golubovic, S. Dimitrijev
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2004.09.002
File:
PDF, 443 KB
english, 2005
Conversion to is in progress
Conversion to is failed