Gate dielectric breakdown in the time-scale of ESD events

Microelectronics Reliability 2005 Vol. 45; Iss. 3-4

Gate dielectric breakdown in the time-scale of ESD events

Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad A. Alam
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Volume:
45
Year:
2005
Language:
english
Pages:
10
DOI:
10.1016/j.microrel.2004.12.004
File:
PDF, 299 KB
english, 2005
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