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Gate dielectric breakdown in the time-scale of ESD events
Bonnie E. Weir, Che-Choi Leung, Paul J. Silverman, Muhammad A. AlamVolume:
45
Year:
2005
Language:
english
Pages:
10
DOI:
10.1016/j.microrel.2004.12.004
File:
PDF, 299 KB
english, 2005