Numerical analysis of a double avalanche region IMPATT...

Microelectronics Reliability 2006 Vol. 46; Iss. 2-4

Numerical analysis of a double avalanche region IMPATT diode on the basis of nonlinear model

Alexander M. Zemliak, Roque De La Cruz
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Volume:
46
Year:
2006
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2005.02.002
File:
PDF, 183 KB
english, 2006
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