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Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers
Sasan Naseh, M. Jamal Deen, Chih-Hung ChenVolume:
46
Year:
2006
Language:
english
Pages:
12
DOI:
10.1016/j.microrel.2005.04.009
File:
PDF, 753 KB
english, 2006