Definition of curve fitting parameter to study tunneling...

Microelectronics Reliability 2006 Vol. 46; Iss. 7

Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures

V. Filip, Hei Wong, D. Nicolaescu
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Volume:
46
Year:
2006
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2005.10.014
File:
PDF, 219 KB
english, 2006
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