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Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology
K.W. Alt, R.E. Yeats, C.P. Hutchinson, D.K. Kuhn, T.S. Low, M. Iwamoto, M.E. Adamski, R.L. Shimon, T.E. Shirley, M. Bonse, F.G. Kellert, D.C. D’AvanzoVolume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.02.007
File:
PDF, 431 KB
english, 2007