New aspects for lifetime prediction of bipolar transistors...

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure

Goroll, Michael, Pufall, Reinhard, Aresu, Stefano, Gustin, Wolfgang
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Volume:
48
Language:
english
Pages:
4
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.010
Date:
August, 2008
File:
PDF, 244 KB
english, 2008
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