Generic simulator for faulty IC

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

Generic simulator for faulty IC

Ferrigno, Julie, Machouat, Aziz, Perdu, Philippe, Lewis, Dean, Haller, Gerald, Goubier, Vincent
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Volume:
48
Language:
english
Pages:
5
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.013
Date:
August, 2008
File:
PDF, 900 KB
english, 2008
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