Voltage-based fault path tracing by transistor operating...

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

Voltage-based fault path tracing by transistor operating point analysis

Sanada, Masaru
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Volume:
48
Language:
english
Pages:
6
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.055
Date:
August, 2008
File:
PDF, 559 KB
english, 2008
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