Two-stage hot-carrier degradation behavior of...

Microelectronics Reliability 2009 Vol. 49; Iss. 1

Two-stage hot-carrier degradation behavior of 0.18 μm 18 V n-type DEMOS and its recovery effect

Chao Gao, Jun Wang, Lei Wang, Andrew Yap, Hong Li
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Volume:
49
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2008.09.009
File:
PDF, 395 KB
english, 2009
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