Subthreshold parameters of radio-frequency multi-finger...

Microelectronics Reliability 2009 Vol. 49; Iss. 4

Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors

Sik-Lam Siu, Hei Wong, Wing-Shan Tam, K. Kakusima, H. Iwai
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Volume:
49
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2009.01.004
File:
PDF, 542 KB
english, 2009
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