Investigation of high-performance sub-50 nm...

Microelectronics Reliability 2011 Vol. 51; Iss. 7

Investigation of high-performance sub-50 nm junctionless nanowire transistors

Ran Yan, Abhinav Kranti, Isabelle Ferain, Chi-Woo Lee, Ran Yu, Nima Dehdashti, Pedram Razavi, Jean-Pierre Colinge
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
51
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2011.02.016
File:
PDF, 1.23 MB
english, 2011
Conversion to is in progress
Conversion to is failed