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Volume 51; Issue 7
Main
Microelectronics Reliability
Volume 51; Issue 7
Microelectronics Reliability
Volume 51; Issue 7
1
Noise properties of thick-film resistors in extended temperature range
Adam Witold Stadler
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 710 KB
Your tags:
english, 2011
2
Investigation of the short-time high-current behavior of vias manufactured in hybrid thick-film technology
Dominique Ortolino
,
Jaroslaw Kita
,
Roland Wurm
,
Emmanuel Blum
,
Karin Beart
,
Ralf Moos
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.02 MB
Your tags:
english, 2011
3
Wide frequency range ac electrical characterization of thick-film microvaristors
M.W. Dudek
,
K. Nitsch
,
A. Dziedzic
,
T. Piasecki
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.13 MB
Your tags:
english, 2011
4
MISFET structures with barium titanate as a dielectric layer for application in memory cells
Piotr Firek
,
Jan Szmidt
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.22 MB
Your tags:
english, 2011
5
Influence of lamination parameters on mechanical properties of low temperature co-fired ceramic tapes
Michael Weilguni
,
Walter Smetana
,
Johann Nicolics
,
Wilfried Kausel
,
Werner Goebl
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 935 KB
Your tags:
english, 2011
6
Micro Ceramic Cell Analyzer (MCCA) – Preliminary results
Karol Malecha
,
Mateusz Czok
,
Anna Hetnar
,
Anna Pawlik
,
Helena Sztajer
,
Leszek J. Golonka
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 439 KB
Your tags:
english, 2011
7
New conductive thick-film paste based on silver nanopowder for high power and high temperature applications
Małgorzata Jakubowska
,
Mateusz Jarosz
,
Konrad Kiełbasinski
,
Anna Młożniak
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.01 MB
Your tags:
english, 2011
8
The influence of inhomogeneous trap distribution on results of DLTS study
Mariusz Kaczmarczyk
,
Maria Kaniewska
,
Olof Engström
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 499 KB
Your tags:
english, 2011
9
Improvement of immunity on MeV electron radiation of MOS structures by means of ultra-shallow fluorine implantation
Małgorzata Kalisz
,
Robert Mroczyński
,
Romuald B. Beck
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 596 KB
Your tags:
english, 2011
10
Investigation of high-performance sub-50 nm junctionless nanowire transistors
Ran Yan
,
Abhinav Kranti
,
Isabelle Ferain
,
Chi-Woo Lee
,
Ran Yu
,
Nima Dehdashti
,
Pedram Razavi
,
Jean-Pierre Colinge
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.23 MB
Your tags:
english, 2011
11
Development and characterisation of nanowire-based FETs
Michał Zaborowski
,
Daniel Tomaszewski
,
Piotr Dumania
,
Piotr Grabiec
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 788 KB
Your tags:
english, 2011
12
Microelectronic materials and structures characterization by impedance spectroscopy
Karol Nitsch
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.17 MB
Your tags:
english, 2011
13
Studies of the quality of GdSiO–Si interface
Marcin Iwanowicz
,
Jakub Jasiński
,
Grzegorz Głuszko
,
Lidia Łukasiak
,
Andrzej Jakubowski
,
Heinrich Gottlob
,
Mathias Schmidt
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 580 KB
Your tags:
english, 2011
14
Numerical prototyping methods in microsystem accelerometers design
Łukasz Dowhań
,
Artur Wymysłowski
,
Stanisław Kaliciński
,
Paweł Janus
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 2.15 MB
Your tags:
english, 2011
15
Integrated SMD pressure/flow/temperature multisensor for compressed air in LTCC technology: Thermal flow and temperature sensing
Thomas Maeder
,
Yannick Fournier
,
Jean-Bastien Coma
,
Nicolas Craquelin
,
Peter Ryser
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 969 KB
Your tags:
english, 2011
16
Electrical characterization of aluminium oxide–aluminium thin film composites by impedance spectroscopy
Katarzyna Tadaszak
,
Karol Nitsch
,
Tomasz Piasecki
,
Witold M. Posadowski
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.25 MB
Your tags:
english, 2011
17
High temperature CoSb3–Cu junctions
Krzysztof Tomasz Wojciechowski
,
Rafal Zybala
,
Ryszard Mania
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1022 KB
Your tags:
english, 2011
18
Determination of electrical and mechanical parameters in capacitive MEMS accelerometers using electrical measurements
Stanisław Kaliciński
,
Tomasz Bieniek
,
Paweł Janus
,
Piotr Grabiec
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1009 KB
Your tags:
english, 2011
19
LTCC package for high temperature applications
Damian Nowak
,
Andrzej Dziedzic
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 965 KB
Your tags:
english, 2011
20
Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD
A. Wiatrowski
,
W.M. Posadowski
,
G. Jóźwiak
,
J. Serafińczuk
,
R. Szeloch
,
T. Gotszalk
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 810 KB
Your tags:
english, 2011
21
Investigation of double barrier MOS tunnel diodes with PECVD silicon quantum well
B. Majkusiak
,
R.B. Beck
,
A. Mazurak
,
J. Grabowski
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 775 KB
Your tags:
english, 2011
22
Carbon nanotubes and silver flakes filled epoxy resin for new hybrid conductive adhesives
F. Marcq
,
P. Demont
,
P. Monfraix
,
A. Peigney
,
Ch. Laurent
,
T. Falat
,
F. Courtade
,
T. Jamin
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.07 MB
Your tags:
english, 2011
23
Study of electrical and optical properties of CNx thin films deposited by reactive magnetron sputtering
E.L. Prociów
,
T. Chodzinski
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.02 MB
Your tags:
english, 2011
24
Processing and recognition of the thermal images using wavelet transforms
Mateusz Kosikowski
,
Zbigniew Suszyński
,
Michał Bednarek
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 1.70 MB
Your tags:
english, 2011
25
10th Electron Technology ELTE 2010 and 34th International Microelectronics and Packaging IMAPS/CPMT Poland Joint Conference – Guest Editorial
Andrzej Dziedzic
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 118 KB
Your tags:
english, 2011
26
Inside front cover - Editorial board
Journal:
Microelectronics Reliability
Year:
2011
Language:
english
File:
PDF, 38 KB
Your tags:
english, 2011
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