Electrical characterization of aluminium oxide–aluminium...

Microelectronics Reliability 2011 Vol. 51; Iss. 7

Electrical characterization of aluminium oxide–aluminium thin film composites by impedance spectroscopy

Katarzyna Tadaszak, Karol Nitsch, Tomasz Piasecki, Witold M. Posadowski
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Volume:
51
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2011.03.030
File:
PDF, 1.25 MB
english, 2011
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