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Two-dimensional simulation of the thermal stress effect on static and dynamic VDMOS characteristics
M. Alwan, B. Beydoun, K. Ketata, M. ZoaeterVolume:
124-125
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.mseb.2005.08.092
File:
PDF, 410 KB
english, 2005