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Modeling and Analysis of PDN Impedance and Switching Noise in TSV-Based 3-D Integration
He, Huanyu, Lu, James Jian-QiangVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2396914
Date:
April, 2015
File:
PDF, 3.58 MB
english, 2015